Panthera TEC MAT
Panthera TEC MAT
The Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education.
Panthera TEC MAT
The Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample. BD models feature LD Plan BD objectives with a superb imaging performance, mounted on a 5-fold nosepiece
Specifications
- Binocular/Trinocular head, siedentopf type Observation Tube
- Widefield UC-WF10X/20mm Eyepieces, +/- 4 diopter on both eyepieces
- CCIS® LD Plan Achromatic & S-Apo (Pb free), DIN
- 5X/0.13 (WD 20.3mm)
- 10X/0.25 (WD 17.5mm)
- 20X/0.40 (WD 8.1mm)
- S-Apo 50X/0.80 (WD 1mm)
- S-Apo 100X/0.90 (WD 0.5 mm)
- Stage Options : 150 x 100mm, 100 x 100 mm, 75 x 50 mm
- Contrast Options : Incident/Transmitted BF. Incident/Transmitted DF, Pol
Contact us for more details : info@mikros-th.com
