Technical cleanliness testing determines the contaminants that could affect the quality and functionality of where the components are manufactured. It is conducted by extracting particles from the surface of the tested part and analyzing them in qualitative and quantitative terms, for the electrical engineering or the automotive and aerospace industries.

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The PSM1000 is an OEM-ready instrument for the best images of flat, reflective specimens. Samples from metallurgy and the semiconductor field are treated by ELWD Plan Apochromatic objectives with a stupendous resolution power. The large FOV24 with an erect, true sided image allows fast orientation and manipulation work.

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The PA200/PA300 series employs a flexible modular design, offering diverse observation modes including brightfield, darkfield, polarization, DIC (differential interference contrast), and fluorescence. Not only does it guarantee exceptional optical performance, but it also features a secure, stable, and integrated body construction. Its low center of gravity, high rigidity, and high stability significantly enhance the microscope’s vibration resistance and capability for stable high-magnification imaging.

Specifications

• Binocular/Trinocular Observation Tube (100:0 / 0:100)
• Erect type (F.N 25) 10X Eyepieces, Diopter adjustable, Reticle optional
• 5-position Motorized Nosepiece with DIC slot
• Stroke range: 30 mm / Coarse and Fine focusing knob
• Coarse: 17.7 mm/revolution / Fine: 0.1 mm/revolution (1 μm scale)
• Upper limit stopper, Torque adjustment ring
• IL switch and ECO switch
• Contrast : IL BF, IL DF, IL Pol, IL DIC, TL BF, UV (Optional)
• Plan S-APO (Standard)
• 5X/0.15 (W.D=20mm)
• 10X/0.3 (W.D=12mm)
• 20X/0.45 (W.D=3mm)
• 50X/0.8 (W.D=1mm)
• 100X/0.9 (W.D=0.5mm)(optional)
• LPlan S-APO(optional)
• 20X/0.4 (W.D=12mm)
• 50X/0.55 (WD=8mm)
• 100X/0.8 (W.D=3.3mm)
• Stage
• 12-inch Manual Stage, 710mm(480mm) X 446mm
• 8-inch Manual Stage, 500mm(350mm) X 350mm

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MPA series is equipped with motorized Z axis, tool microscope host integrates Z axis coarse adjustment, fine focusing, Z axis data reset, integrated Z axis control handle, ergonomic design, high degree of integration, convenient operation to reduce the occurrence of fatigue.

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Motic’s AE2000MET is an Inverted Metallurgical microscope designed to inspect polished cross-sections as well as larger, bulky samples within industries such as automotive, machinery, and metal fabrication. Large metal or die cast parts, too large to view under a conventional upright microscope, can easily be examined for failure analysis, material research or quality control.

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The PA53MET provides customizable optics and lighting systems, such as BF, BF/DF or DIC to meet all user needs. Reflected Light and Transmitted Light can be used simultaneously for unique samples when needed. This microscope can be upgraded to a motorized stage for Low Magnification Tiling of large samples.

Specifications

• Binocular/Trinocular Observation Tube (100:0 / 0:100)
• Erect type (F.N 25) 10X Eyepieces, Diopter adjustable, Reticle optional
• 5-position Nosepiece with DIC slot
• Stroke range: 29.5 mm / Coarse and Fine focusing knob., Motorized Z (PA53 MET 3D)
• Coarse: 17.7 mm/revolution / Fine: 0.1 mm/revolution (1 μm scale)
• Upper limit stopper, Torque adjustment ring
• IL switch and ECO switch
• Length x width x height 246 x 572 x 514mm
• Contrast : IL BF, IL DF, IL Pol, TL BF
• Plan S-APO (Standard)
• 5X/0.15 (W.D=20mm)
• 10X/0.3 (W.D=12mm)
• 20X/0.45 (W.D=3mm)
• 50X/0.8 (W.D=1mm)
• 100X/0.9 (W.D=0.5mm)(optional)
• LPlan S-APO(optional)
• 20X/0.4 (W.D=12mm)
• 50X/0.55 (WD=8mm)
• 100X/0.8 (W.D=3.3mm)
• Stage 4×4″ Stage, 6×6” (Optional)

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A new level of Transmitted/Incident light microscope for diverse Polarization applications:

Panthera TEC POL Epi Trino is a trinocular microscope with a set of UC Plan Achromatic objectives, working with UC eyepieces of 20mm Field of View. An interchangeable 30W Halogen/3W LED light source is part of a Full-Köhler setup in Transmitted light. Incident light is provided by a compact illuminator with 3W LED light source. The Motic LightTracer system with memory function, a built-in Low-Energy mode and an LED feedback indicator helps to optimize your workflow.

Specifications

• Binocular/Trinocular head, siedentopf type Observation Tube
• Widefield UC-WF10X/20mm Eyepieces, +/- 4 diopter on both eyepieces
• CCIS® LD Plan Achromatic & S-Apo (Pb free), DIN
• 5X/0.13 (WD 20.3mm)
• 10X/0.25 (WD 17.5mm)
• 20X/0.40 (WD 8.1mm)
• S-Apo 50X/0.80 (WD 1mm)
• Circular rotating 360º, lockable , Mechanical XY stage (Optional)
• Contrast Options : POL EPI, POL TL, Bertrand Lens

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The Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample. BD  models  feature LD Plan BD objectives  with  a  superb  imaging performance, mounted on a 5-fold nosepiece

Specifications

• Binocular/Trinocular head, siedentopf type Observation Tube
• Widefield UC-WF10X/20mm Eyepieces, +/- 4 diopter on both eyepieces
• CCIS® LD Plan Achromatic & S-Apo (Pb free), DIN
• 5X/0.13 (WD 20.3mm)
• 10X/0.25 (WD 17.5mm)
• 20X/0.40 (WD 8.1mm)
• S-Apo 50X/0.80 (WD 1mm)
• S-Apo 100X/0.90 (WD 0.5 mm)
• Stage Options : 150 x 100mm, 100 x 100 mm, 75 x 50 mm
• Contrast Options : Incident/Transmitted BF. Incident/Transmitted DF, Pol

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