MoticNet 4.0

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AE31E LED

Specifications

• Trinocular head, Siedentopf type, 360° swiveling
• Colour Corrected Infinity Optical System (CCIS®)
• Focusable and centerable ELWD condenser N.A. 0.30 (WD 72mm)
• Widefield WF10X/22mm with diopter adjustment
• Coaxial coarse and fine focusing system with tension adjustment
• Working distance without condenser 231mm
• Auto-OFF and Light Memory function
• Quartz halogen 6V/30W or LED 3W
• CCIS® Plan Achromatic, DIN
• 4X/0.10 (WD 12.6mm)
• PH10X/0.25 (WD 4.1mm)
• LWD PH20X/0.30 (WD 4.7mm)
• [Optional] LWD PH40X/0.50 (WD 3.0mm)
• 200x239mm Stage Size with Optional mechanical XY

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Research Level Microscope

Specifications

• Colour Corrected Infinity Optical System (CCIS®)
• Trinocular head, Siedentopf type, 30° inclined, 100:0/20:80/0:100
• Widefield WF10X/25mm with diopter adjustment
• Reversed quintuple, coded
• CCIS® HPlan S-APO (Fluor)
• 4X/0.13 (WD 17.3mm)
• 10X/0.3 (WD 11.7mm)
• 40X/0.75/S (WD 0.7mm)
• 100X/1.3/S-Oil (WD 0.1mm)
• Mechanical stage with built-in low position rackless coaxial stage control and sample holder
• Focusable and centerable Abbe condenser N.A. 0.90/1.25 with slot for contrast sliders
• Coaxial coarse and fine focusing system with tension adjustment
• 29.5mm – Coarse: 17.7mm/revolution – Fine: 0.1mm/revolution (1µm scale)
• Halogen/LED illumination Source
• Contrast BF, DF, PH, Simple Pol, Fluorescent

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Routine Grade Microscope

Specifications

• Colour Corrected Infinity Optical System (CCIS®)
• Trinocular head 30º inclined ; Interpupillary distance 48-75mm
• Fixed 50:50 Light Split
• Widefield WF 10X Eyepieces FOV-20mm with diopter adjustment
• Reversed quintuple revolving nosepiece Coded
• CCIS® Plan Achromatic UC objectives
• Objective information
• 4X/0.10 (WD 30.5 mm)
• 10X/0.25 (WD 17.4mm)
• 40X/0.65/S (WD 0.6mm)
• 60X/0.8/S (WD 0.35 mm)(Optional)
• 100X/1.25/S-Oil (WD 0.14mm)
• Built in mechanical rackless stage (Right-hand control)
• X&Y Mechanical Stage range 75 x 50mm
• Focusable Abbe condenser N.A. 1.25 with iris diaphragm and slider slot
• Turret condenser for BF/DF/PH (Optional)
• Coaxial coarse and fine focusing adjustment with tension adjustment
• LED illumination with Motic Light Tracer
• Contrast BF, DF, PH, Simple Pol, Fluorescent
• Accessories included Immersion oil (5ml), power cord, allen hexagonal key, thumb screw,
• vinyl dust cover
• Length x width x height 282x210x396mm
• Weight 8.4kg

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Entry Level Microscope for Routine Application

Specifications

• Colour Corrected Infinity Optical System (CCIS®)
• Trinocular head 30º inclined ; Interpupillary distance 48-75mm
• Fixed 50:50 Light Split
• Widefield WF 10X Eyepieces FOV-20mm with diopter adjustment
• Reversed quadruple revolving nosepiece
• CCIS® Plan SC objectives
• Objective information
• 4X/0.10 (WD 15.5mm)
• 10X/0.25 (WD 17.4mm)
• 40X/0.65/S (WD 0.6mm)
• 100X/1.25/S-Oil (WD 0.14mm)
• Built in mechanical rackless stage (Right-hand control)
• X&Y Mechanical Stage range 76 x 40mm
• Focusable Abbe condenser N.A. 1.25 with iris diaphragm and slider slot
• Coaxial coarse and fine focusing adjustment with tension adjustment
• 3W LED illumination with intensity control
• Contrast BF, DF, PH, Simple Pol
• Accessories included Immersion oil (5ml), power cord, allen hexagonal key, thumb screw,
• vinyl dust cover
• Length x width x height 360 x 190 x 398mm
• Weight 7.4kg

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The PSM1000 is an OEM-ready instrument for the best images of flat, reflective specimens. Samples from metallurgy and the semiconductor field are treated by ELWD Plan Apochromatic objectives with a stupendous resolution power. The large FOV24 with an erect, true sided image allows fast orientation and manipulation work.

Please contact us for further specification and available options

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The PA200/PA300 series employs a flexible modular design, offering diverse observation modes including brightfield, darkfield, polarization, DIC (differential interference contrast), and fluorescence. Not only does it guarantee exceptional optical performance, but it also features a secure, stable, and integrated body construction. Its low center of gravity, high rigidity, and high stability significantly enhance the microscope’s vibration resistance and capability for stable high-magnification imaging.

Specifications

• Binocular/Trinocular Observation Tube (100:0 / 0:100)
• Erect type (F.N 25) 10X Eyepieces, Diopter adjustable, Reticle optional
• 5-position Motorized Nosepiece with DIC slot
• Stroke range: 30 mm / Coarse and Fine focusing knob
• Coarse: 17.7 mm/revolution / Fine: 0.1 mm/revolution (1 μm scale)
• Upper limit stopper, Torque adjustment ring
• IL switch and ECO switch
• Contrast : IL BF, IL DF, IL Pol, IL DIC, TL BF, UV (Optional)
• Plan S-APO (Standard)
• 5X/0.15 (W.D=20mm)
• 10X/0.3 (W.D=12mm)
• 20X/0.45 (W.D=3mm)
• 50X/0.8 (W.D=1mm)
• 100X/0.9 (W.D=0.5mm)(optional)
• LPlan S-APO(optional)
• 20X/0.4 (W.D=12mm)
• 50X/0.55 (WD=8mm)
• 100X/0.8 (W.D=3.3mm)
• Stage
• 12-inch Manual Stage, 710mm(480mm) X 446mm
• 8-inch Manual Stage, 500mm(350mm) X 350mm

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Motic’s AE2000MET is an Inverted Metallurgical microscope designed to inspect polished cross-sections as well as larger, bulky samples within industries such as automotive, machinery, and metal fabrication. Large metal or die cast parts, too large to view under a conventional upright microscope, can easily be examined for failure analysis, material research or quality control.

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The PA53MET provides customizable optics and lighting systems, such as BF, BF/DF or DIC to meet all user needs. Reflected Light and Transmitted Light can be used simultaneously for unique samples when needed. This microscope can be upgraded to a motorized stage for Low Magnification Tiling of large samples.

Specifications

• Binocular/Trinocular Observation Tube (100:0 / 0:100)
• Erect type (F.N 25) 10X Eyepieces, Diopter adjustable, Reticle optional
• 5-position Nosepiece with DIC slot
• Stroke range: 29.5 mm / Coarse and Fine focusing knob., Motorized Z (PA53 MET 3D)
• Coarse: 17.7 mm/revolution / Fine: 0.1 mm/revolution (1 μm scale)
• Upper limit stopper, Torque adjustment ring
• IL switch and ECO switch
• Length x width x height 246 x 572 x 514mm
• Contrast : IL BF, IL DF, IL Pol, TL BF
• Plan S-APO (Standard)
• 5X/0.15 (W.D=20mm)
• 10X/0.3 (W.D=12mm)
• 20X/0.45 (W.D=3mm)
• 50X/0.8 (W.D=1mm)
• 100X/0.9 (W.D=0.5mm)(optional)
• LPlan S-APO(optional)
• 20X/0.4 (W.D=12mm)
• 50X/0.55 (WD=8mm)
• 100X/0.8 (W.D=3.3mm)
• Stage 4×4″ Stage, 6×6” (Optional)

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The Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample. BD  models  feature LD Plan BD objectives  with  a  superb  imaging performance, mounted on a 5-fold nosepiece

Specifications

• Binocular/Trinocular head, siedentopf type Observation Tube
• Widefield UC-WF10X/20mm Eyepieces, +/- 4 diopter on both eyepieces
• CCIS® LD Plan Achromatic & S-Apo (Pb free), DIN
• 5X/0.13 (WD 20.3mm)
• 10X/0.25 (WD 17.5mm)
• 20X/0.40 (WD 8.1mm)
• S-Apo 50X/0.80 (WD 1mm)
• S-Apo 100X/0.90 (WD 0.5 mm)
• Stage Options : 150 x 100mm, 100 x 100 mm, 75 x 50 mm
• Contrast Options : Incident/Transmitted BF. Incident/Transmitted DF, Pol

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