The PA53MET provides customizable optics and lighting systems, such as BF, BF/DF or DIC to meet all user needs. Reflected Light and Transmitted Light can be used simultaneously for unique samples when needed. This microscope can be upgraded to a motorized stage for Low Magnification Tiling of large samples.

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The Panthera TEC offers high value for the inspection of semiconductors and and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic segmental illumination that all contribute to the versatility of this model. This concept allows an oblique incident illumination, perfect for the detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample. BD  models  feature LD Plan BD objectives  with  a  superb  imaging performance, mounted on a 5-fold nosepiece

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